DELMIC

Sapphires grow in particular environments that are of great interest to geologists. To gain a better understanding of these environments, researchers recently used cathodoluminescence (CL) imaging to study sapphire crystallization histories.

Discover how they used CL imaging and explore what they found in our latest blog post: https://bit.ly/48lab8L

Exciting day ahead at Cell Bio 2023 in Boston! Delmic is thrilled to be part of this conference, offering a day packed with insightful presentations. Join us for an advancing experience and be part of the scientific dialogue!

Can you use cathodoluminescence (CL) imaging to study your material of interest? And has this been done before?

Discover which materials can be effectively studied using CL, and explore the main application fields where CL serves as a valuable research tool in our latest blog post.

Read it now: https://bit.ly/47L8q4F

Will you be attending the CryoOz 2023 Symposium this week? Visit our poster presentation by Wessel Teunisse to discover how to enhance your Cryo-ET workflow.

We can't wait to connect with you there! See you soon!

What is the latest cryo-EM research in the field of drug development? And how can cryo-EM effectively be used for the development of medicine and vaccines?

Discover the answers to these questions in our whitepaper, highlighting revolutionary insights into SARS-CoV-2, HIV, and cystic fibrosis using cryo-EM. Download it here: https://bit.ly/3smssU6

3D or Volume electron microscopy (vEM) is a set of techniques that have been revolutionizing life science research recently. Therefore, we decided to create a simple overview of the main SEM-based vEM techniques, highlighting their strengths and recent improvements.

Read the blog post here: https://bit.ly/3u5xvZl

Our very own Life Sciences Director, Katherine Lau, will deliver a poster presentation at Cell Symposia in Huangshan next week! Make sure to check out the schedule and mark your calendars to catch her in action! We hope to see you there👋.

Taking SiC-powered MOSFETs to space - how hard could that be?

Well, it was found that heavy-ion irradiation in space damages these devices. Using cathodoluminescence spectroscopy, researchers have recently investigated the different types of defects that occur in detail.

Read more in our new blog post: https://bit.ly/3MfSMG6

SiC-Powered MOSFETs: Defect Formation In Space Discover how researchers investigate defect formation in irradiated SiC-powered MOSFETs in space using cathodoluminescence spectroscopy.

'Sure, but how??' Find out in our upcoming webinar, and take your research to the next level! Sign up here: https://bit.ly/3tDFX1U

Do you know how the camera of a cryo fluorescence light microscope influences the quality of fluorescent images?

Discover in our blog post which parameters you should pay extra attention to when choosing a camera, and how they affect your final result. Read it here: https://bit.ly/3RY6CAJ

How to choose a suitable camera for cryo-fluorescence light microscopy? Discover which parameters to consider when choosing a camera for a cryo-fluorescence system, and how they will define the fluorescence image quality.

Two dimensional semiconductors enable next-generation integrated optoelectronics - but studying them is difficult.

Cathodoluminescence (CL) can give valuable insights into these materials, which is why our application specialist Noémie Bonnet simplified the CL workflow by using silicon dioxide substrates.

Join our webinar to find out how to apply this to your own research, and be part of the discussions! Don't miss out, and sign up here: https://bit.ly/3PPwgoE

Volume electron microscopy (vEM) techniques could revolutionize the way in which life science research is being done - but their low throughput is a major bottleneck.

Discover in our new blog post how this challenge has inspired the development of our fast and automated electron microscopy: The FAST-EM.

Read it here: https://bit.ly/3ZLMljA

Increasing the throughput of volume electron microscopy with FAST-EM Discover how a need for a more automated volume electron microscopy (vEM) workflow with higher throughput has led to the development of the FAST-EM.