Yieldhub

Your test floor shouldn't be a black box.

In this short video 🎥, yieldHUB CEO John O'Donnell explains how yieldHUB Live transforms semiconductor test operations from a black box into a transparent, data-driven environment, enabling teams to detect issues earlier, reduce retest, improve tester utilization and make faster decisions.

The result? Higher yield, greater engineering productivity, and improved manufacturing efficiency.

Learn more: https://www.yieldhub.com/yieldhub-live

Deep domain expertise in test engineering is built over years of real manufacturing experience.

Our CEO, John O'Donnell, spent 17 and a half years as a test engineer across global manufacturing in Silicon Valley, Asia and Ireland. An early STDF adopter and contributor to AEC-Q001 📖, he built yieldHUB in 2005 around real production challenges, growing a team of experienced semiconductor professionals because that context matters 💡

yieldHUB was built by test engineers, for test engineers. Today, it supports every engineer from design through to high-volume manufacturing.

From NPI to production, teams use yieldHUB to solve real yield challenges ⚙️ We have helped companies scale from early wafer runs to high-volume production on the same platform 📈

Learn more: https://www.yieldhub.com

Most yield problems don’t start at final test. They start much earlier ⬇️

When fab data is disconnected from wafer probe and final test, issues are found too late, impacting yield and product quality.

In this clip, John O'Donnell explains how yieldHUB enables earlier wafer acceptance decisions, helping engineers reject wafers before they impact final test yield.

This is especially important in high volume semiconductor manufacturing 🏭, where small wafer level issues can quickly turn into significant yield loss 📈

“What used to take days can now be done in minutes.” 📈

In this video, John O'Donnell shares how Product Engineers are changing the way they work with semiconductor test data.

yieldHUB brings test data together so teams can:
• 📊 Track yield and parametric distributions across lots, wafers and sites
• 🔍 Query and drill into millions of datapoints from wafer probe through final test
• 🔗 Stack wafers and correlate data across probe, final test and multiple flows
• ⚡ Generate plots, bin summaries and comparisons directly from the dataset
• 🌡️ Analyse parametric variation across voltage, temperature and test conditions
• 🎯 Trace devices at unit level and monitor yield stability during ramp

“Knowing the distribution of yield across sites is extremely important… and it’s right in front of you in seconds.”

“We were able to show variation at different voltages and temperatures all in one plot… we improved yield by 4% and it’s now very stable.”

This is what engineering looks like when the data is connected.

If you're working on yield, NPI or test efficiency and want to see how this works in practice.

👉 Comment YIELD and we’ll send details you can share with your engineering team.

We’re proud to support customers in Korea’s 🇰🇷 advanced semiconductor sector, where data security and rapid resolution of yield challenges are critical.

In a recent video, our CEO John O'Donnell highlighted an important point 💡 : in some cases, customers run yieldHUB entirely on-premise, meaning we never access their data at all. They retain full control while still benefiting from the platform’s analytics capabilities.

Whether deployed in a secure cloud environment ☁️ or fully on-premise 🏭 , our platform is designed to deliver powerful analytics while keeping sensitive data protected 🔐.

Thanks to Hayoung Chun and Taewon Um for their support and collaboration on this Korean-language blog.

Read more here: https://blog.naver.com/enterprise-ireland/224255304646