Oxford Instruments

– 𝗝𝘂𝗽𝗶𝘁𝗲𝗿 𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿𝘆 𝗔𝗙𝗠 – Launch Day – 🚀

We’re excited to introduce the new Jupiter Discovery Atomic Force Microscope.
This next-generation large-sample AFM delivers best-in-class performance combined with exceptional ease of use.

🔹Simplified Workflow for Maximum Productivity
Pre-mounted probes, a unique side-view camera, and exclusive FFM-Topography imaging mode with AutoPilot simplify the entire imaging workflow.

🔹Next-Generation Design for Ultimate Performance
Jupiter Discovery achieves ultra-high resolution and scan rates 5-20x faster than other large-sample AFMs to set a new benchmark in its segment.

🔹Unmatched Configurability for Meeting Diverse Challenges
A vast selection of accessories and capabilities enables multidisciplinary research, while configuration options help span a wider range of research budgets.

𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗡𝗲𝘅𝘁-𝗚𝗲𝗻𝗲𝗿𝗮𝘁𝗶𝗼𝗻 𝗔𝗙𝗠 𝗣𝗲𝗿𝗳𝗼𝗿𝗺𝗮𝗻𝗰𝗲, 𝗳𝗼𝗿 𝗘𝘃𝗲𝗿𝘆𝗼𝗻𝗲:
https://okt.to/XYAIWo

Image 1: Jupiter Discovery; Image 2: Pre-mounted probe; Image 3: Side-view camera image; Image 4: Silicon photonics waveguide structures imaged using FFM-Topography with AutoPilot mode, 18 µm scan size; Image 5: Silicon carbide substrate with 0.75 nm steps. Imaged using FFM-Topography with AutoPilot mode, 5 µm scan size