International Test Conference

𝐁𝐞𝐲𝐨𝐧𝐝 𝐞𝐱𝐡𝐢𝐛𝐢𝐭𝐬, 𝐛𝐞𝐲𝐨𝐧𝐝 𝐭𝐞𝐜𝐡𝐧𝐨𝐥𝐨𝐠𝐲, 𝐭𝐡𝐢𝐬 𝐢𝐬 𝐰𝐡𝐞𝐫𝐞 𝐭𝐡𝐞 𝐬𝐞𝐦𝐢𝐜𝐨𝐧𝐝𝐮𝐜𝐭𝐨𝐫 𝐜𝐨𝐦𝐦𝐮𝐧𝐢𝐭𝐲 𝐜𝐨𝐦𝐞𝐬 𝐭𝐨𝐠𝐞𝐭𝐡𝐞𝐫.

𝐓𝐡𝐞 𝐄𝐱𝐡𝐢𝐛𝐢𝐭 𝐙𝐨𝐧𝐞 𝐚𝐭 𝐈𝐓𝐂 𝐈𝐧𝐝𝐢𝐚 𝟐𝟎𝟐𝟔 𝐢𝐬 𝐧𝐨𝐰 𝐨𝐩𝐞𝐧, creating a platform for innovators, researchers, and industry pioneers to connect, collaborate, and showcase technologies that are shaping the future.

From insightful demonstrations to meaningful interactions, every booth tells a story of innovation and progress.

Ideas are being showcased. Partnerships are being built. The future is being engineered.

𝐑𝐞𝐬𝐞𝐚𝐫𝐜𝐡 𝐭𝐡𝐚𝐭 𝐝𝐫𝐢𝐯𝐞𝐬 𝐭𝐡𝐞 𝐟𝐮𝐭𝐮𝐫𝐞 𝐝𝐞𝐬𝐞𝐫𝐯𝐞𝐬 𝐫𝐞𝐜𝐨𝐠𝐧𝐢𝐭𝐢𝐨𝐧.

Congratulations to 𝐇𝐢𝐥𝐚𝐲 𝐏𝐚𝐭𝐞𝐥, 𝐍𝐚𝐦𝐚𝐧 𝐊𝐚𝐥𝐫𝐚, 𝐚𝐧𝐝 𝐉𝐚𝐲𝐧𝐚𝐫𝐚𝐲𝐚𝐧 𝐓. 𝐓𝐮𝐝𝐮 from 𝐈𝐈𝐓 𝐓𝐢𝐫𝐮𝐩𝐚𝐭𝐢 on their paper,"𝐑𝐋-𝐃𝐫𝐢𝐯𝐞𝐧 𝟑𝐃 𝐂𝐥𝐮𝐬𝐭𝐞𝐫𝐢𝐧𝐠 𝐨𝐟 𝐉𝐒𝐜𝐚𝐧 𝐀𝐫𝐜𝐡𝐢𝐭𝐞𝐜𝐭𝐮𝐫𝐞 𝐰𝐢𝐭𝐡 𝐑𝐨𝐮𝐭𝐢𝐧𝐠 𝐚𝐧𝐝 𝐀𝐫𝐞𝐚 𝐎𝐩𝐭𝐢𝐦𝐢𝐳𝐚𝐭𝐢𝐨𝐧 𝐢𝐧 𝐂𝐡𝐢𝐩𝐥𝐞𝐭 𝐒𝐢𝐏," being nominated for the Best Paper Award at the 𝟏𝟎𝐭𝐡 𝐈𝐄𝐄𝐄 𝐈𝐧𝐭𝐞𝐫𝐧𝐚𝐭𝐢𝐨𝐧𝐚𝐥 𝐓𝐞𝐬𝐭 𝐂𝐨𝐧𝐟𝐞𝐫𝐞𝐧𝐜𝐞 𝐈𝐧𝐝𝐢𝐚 𝟐𝟎𝟐𝟔.

Their innovative contribution highlights the growing intersection of Reinforcement Learning and advanced semiconductor system design, paving the way for intelligent, scalable, and optimized chiplet-based architectures.
We are proud to celebrate this achievement and look forward to the impact this research will create within the semiconductor community.

🏆 Recognizing ideas that push the boundaries of innovation and shape the future of intelligent silicon.

𝐒𝐈 𝐂𝐨𝐦𝐩𝐥𝐞𝐱𝐢𝐭𝐲 𝐭𝐨 𝐀𝐈 𝐑𝐞𝐯𝐨𝐥𝐮𝐭𝐢𝐨𝐧: 𝐈𝐧𝐝𝐢𝐚'𝐬 𝐒𝐢𝐥𝐢𝐜𝐨𝐧 𝐋𝐞𝐚𝐩 𝟐𝟎𝟒𝟕

We are delighted to welcome Senthilkumar Dhamodharan from 𝐂𝐚𝐥𝐢𝐛𝐞𝐫 𝐈𝐧𝐭𝐞𝐫𝐜𝐨𝐧𝐧𝐞𝐜𝐭𝐬 for an inspiring keynote on the transformative journey of India's semiconductor ecosystem and the role of Artificial Intelligence in driving the next wave of technological advancement.

This visionary keynote explores India's journey from addressing signal integrity complexities to embracing the transformative power of Artificial Intelligence in shaping the future semiconductor ecosystem. The session offers valuable insights into emerging opportunities, technological advancements, and India's growing role in driving global semiconductor innovation.

A powerful discussion on how innovation, collaboration, and AI will pave the way for India's semiconductor aspirations toward 2047.

𝐒𝐢𝐥𝐞𝐧𝐭 𝐃𝐚𝐭𝐚 𝐂𝐨𝐫𝐫𝐮𝐩𝐭𝐢𝐨𝐧 𝐛𝐲 𝟏𝟎𝐗 𝐓𝐞𝐬𝐭 𝐄𝐬𝐜𝐚𝐩𝐞𝐬 𝐓𝐡𝐫𝐞𝐚𝐭𝐞𝐧𝐬 𝐑𝐞𝐥𝐢𝐚𝐛𝐥𝐞 𝐂𝐨𝐦𝐩𝐮𝐭𝐢𝐧𝐠

We are privileged to host 𝐏𝐫𝐨𝐟. 𝐒𝐮𝐛𝐡𝐚𝐬𝐢𝐬𝐡 𝐌𝐢𝐭𝐫𝐚 from 𝐒𝐭𝐚𝐧𝐟𝐨𝐫𝐝 𝐔𝐧𝐢𝐯𝐞𝐫𝐬𝐢𝐭𝐲 for a thought-provoking keynote addressing one of the most critical challenges in modern computing - ensuring system reliability in increasingly complex semiconductor systems.

As computing systems become increasingly complex, even a small number of undetected defects can have significant consequences on system reliability and trustworthiness. This keynote explores the growing challenge of silent data corruption and emphasizes the critical role of advanced test methodologies in enabling dependable computing systems.

An enlightening session highlighting why reliability and resilience remain at the forefront of semiconductor innovation.

𝐃𝐞𝐬𝐢𝐠𝐧𝐢𝐧𝐠 𝐂𝐡𝐢𝐩𝐥𝐞𝐭𝐬 𝐚𝐧𝐝 𝟑𝐃𝐈𝐂 𝐟𝐨𝐫 𝐐𝐮𝐚𝐥𝐢𝐭𝐲 𝐚𝐧𝐝 𝐑𝐞𝐥𝐢𝐚𝐛𝐢𝐥𝐢𝐭𝐲

We are honored to welcome 𝐃𝐫. 𝐘𝐞𝐫𝐯𝐚𝐧𝐭 𝐙𝐨𝐫𝐢𝐚𝐧 to 𝐈𝐓𝐂 𝐈𝐧𝐝𝐢𝐚 𝟐𝟎𝟐𝟔 for an insightful keynote exploring the future of advanced semiconductor integration and the critical importance of ensuring quality and reliability in next-generation silicon systems.

As heterogeneous integration and advanced packaging continue to redefine semiconductor innovation, ensuring the quality, reliability, and testability of chiplet-based systems has become increasingly critical. This keynote provides valuable perspectives on the challenges and opportunities shaping the future of next-generation semiconductor architectures.

A truly inspiring session that sets the stage for the evolving era of intelligent and interconnected silicon systems.

https://www.itctestweek.org/ai-in-test-ait-workshop-cfp/ We have a new AI workshop at ITC this year.

AI in Test (AIT) Workshop CFP - International Test Conference Special Call for Session Proposals AI in Test (AIT) Workshop 2026 International Test Conference (ITC) Dear Colleagues, Artificial Intelligence (AI) is rapidly reshaping semiconductor test engineering. Engineers are increasingly adopting AI assistants, agentic coding environments, custom AI agents, M...

Don't miss the AI User Forum at the International Test Conference - https://www.itctestweek.org/announcing-special-session-on-ai-2/

submission deadline is June 26

Announcing special session on AI - International Test Conference Artificial Intelligence (AI) is rapidly transforming the way engineers interact with semiconductor test, debug, validation, and analytics workflows. From LLM-assisted scripting and automated document handling to fully agentic analytics systems capable of planning and executing complex tasks, AI tech...

https://www.itctestweek.org/industry-test-challenges-meeting/ The International Test Conference (ITC) registration is open. Join us for a special event - the Industry Test Challenges meeting on Sunday this year. There is limited space for this special informal opportunity to hear from leaders in electronics test.

Industry Test Challenges Meeting - International Test Conference The Industry Test Challenges meeting at the International Test Conference (ITC@ITC) is an event that has been led by Phil Nigh for many years as a side gathering on Monday of Test Week. Despite Phil’s retirement, but with his ongoing support, we are continuing this tradition but elevating it to be...